Sienna Technologies is at the cutting edge of technology through advanced Research and Development. Sienna scientists actively participate in the scientific conferences and present their findings.
Okojie, R., Nguyen, V., Savrun, E., and Lukco, D. “Suppressing Temperature Induced Voltage Offset Drifts in Silicon Carbide Pressure Sensors” International Conference on High Temperature Electronics, HiTEC 2012, May 8-10,Albuqerque,NM
Okojie, R., and Savrun, E., “Emerging Silicon Carbide Pressure Sensors Embedded in Ceramic Matrix Composites” National Missile and Space Materials Symposium, Tampa, FL June 25-29, 2012
